F35013 — TM54F: Test stop error

The drive raises F35013 when a fault is detected during the forced checking procedure — the test stop — of the failsafe digital inputs/outputs (F-DI, F-DO) on the TM54F Terminal Module. During the test stop, failsafe control signals (failsafe values) are transferred to the safety functions; the test switches the F-DI, DI and Diag-DO channels through defined levels and compares the switching signals of the two channels. The fault value stored in r0949 identifies the channel whose expected state was not assumed, the cause, and the test stop step in which the fault occurred.

• A fault was detected during the forced checking procedure (test stop) of the failsafe digital inputs/outputs on the TM54F.
• The channel named in the fault value did not assume its expected state: the cause is either an internal fault (bb = 01 hex or 03 hex) or a mismatch when comparing the switching signals of the two channels — F-DI or DI (bb = 02 hex) or Diag-DO (bb = 04 hex).
• Fault values CCCCCCCC hex, DDDDDDDD hex and EEEEEEEE hex occur together with fault F35152.

1. Check the wiring of the F-DIs and F-DOs.
2. Restart the test stop; the fault is withdrawn if the test stop is successfully completed.
3. If the fault value is CCCCCCCC hex, DDDDDDDD hex or EEEEEEEE hex: check all parameters for the test stop.
4. Also check whether the firmware version of the TM54F matches that of the Control Unit.
5. Check p10001, p10017, p10046 and p10047.
6. Carry out a POWER ON after correcting the parameters.

• The drive stores the fault value in r0949; interpret it hexadecimal as aaaabbcc hex.
• aaaa: the DO or F-DI (dependent on test step cc) where the expected state was not assumed — bit 0 = F-DI 0 or F-DO 0, bit 1 = F-DI 1 or F-DO 1, etc.
• bb, the fault cause: 01 hex = internal fault; 02 hex = fault when comparing the switching signals of the two channels (F-DI or DI); 03 hex = internal fault; 04 hex = fault when comparing the switching signals of the two channels (Diag-DO).
• cc: the state of the test stop in which the fault occurred. The manual tabulates every state with the test actions on the slave and the corresponding step for the master — synchronization and switching steps, wait steps, the F-DI checks for 0 V and the Diag-DO/DI checks.
• When the F-DOs are tested, the expected states to be checked depend on the parameterized test mode (p10047); the manual's table gives the expected Diag-DO level (0 V or 24 V) and the expected DI 20 ... 23 level for each test step pair in modes 1, 2 and 3.
• Timing: if a fault with cause bb = 02 hex or 04 hex occurs in a test stop step, the test action for the fault took place in the previous step, and the expected states are tested in the next step.
• Fault values CCCCCCCC hex, DDDDDDDD hex and EEEEEEEE hex occur together with fault F35152.

• r0949 — fault value: read the fault value here and interpret it hexadecimal to decode the channel (aaaa), the cause (bb) and the test stop step (cc).
• p10047 — SI F-DO testmodeP1, SI Motion F-DO test stop mode (processor 1): the expected states checked in the F-DO test steps depend on the mode set here, so verify it when decoding the fault value.
• p10001 — SI t_delay DO P1, SI Motion wait time for test stop at DO (processor 1): one of the test stop parameters to check when the fault value is CCCCCCCC hex, DDDDDDDD hex or EEEEEEEE hex.
• p10017 — SI DI t_debounceP1, SI Motion digital inputs debounce time (processor 1): check this test stop parameter as well for those fault values.
• p10046 — SI F-DO FS act, SI Motion F-DO feedback signal input activation: likewise part of the test stop parameters to review for those fault values.

The fault is withdrawn if the test stop is successfully completed: after checking the wiring of the F-DIs and F-DOs, restart the test stop. For the fault values CCCCCCCC hex, DDDDDDDD hex and EEEEEEEE hex, correct the parameters and then carry out a POWER ON — the manual requires the POWER ON after the parameters have been corrected.